Alexander Zintler

Work

University of Antwerp
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Technical expert TEM

Belgium

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Karlsruher Institut für Technologie Fakultät für Physik
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Postdoc

Germany

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Technische Universität Darmstadt
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PhD student

Germany

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Publications

Influence of Atmospheric Conditions on the Structural Evolution upon Heating of the ZnAl-Layered Double Hydroxide: A Comprehensive <i>In Situ</i> Transmission Electron Microscopy Study

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ACS Applied Materials & Interfaces

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In Situ Study of the Activation Process of MOF-74 Using Three-Dimensional Electron Diffraction

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Chemistry of Materials

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In Situ TEM Investigation of Conductive Bridge RAM Devices

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Microscopy and Microanalysis

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Weld-free mounting of lamellae for electrical biasing operando TEM

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Ultramicroscopy

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Inkjet‐Printed Tungsten Oxide Memristor Displaying Non‐Volatile Memory and Neuromorphic  Properties

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Advanced Functional Materials

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Texture Transfer in Dielectric Layers via Nanocrystalline Networks: Insights from in Situ 4D-STEM

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Nano Letters

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Martensitic phase transformation in short-range ordered Fe50Rh50 system induced by thermal stress and mechanical deformation

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Acta Materialia

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Translational Antiphase Boundaries in NaNbO<sub>3</sub> Antiferroelectrics

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ACS Applied Materials &amp; Interfaces

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Operando two-terminal devices inside a transmission electron microscope

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Communications Engineering

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Ferromagnetic Mn–Al–C L1<sub>0</sub> Formation by Electric Current Assisted Annealing

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Advanced Engineering Materials

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Oxide thickness-dependent resistive switching characteristics of Cu/HfO2/Pt ECM devices

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Applied Physics Letters

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Controlling the Formation of Conductive Pathways in Memristive Devices

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Advanced Science

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Structural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation

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ACS Nano

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Enhanced Conductivity and Microstructure in Highly Textured TiN1–x/c-Al2O3 Thin Films

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ACS Omega

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Defect-Stabilized Substoichiometric Polymorphs of Hafnium Oxide with Semiconducting Properties

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ACS Applied Materials & Interfaces

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Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching

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Advanced Electronic Materials

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Role of Oxygen Defects in Conductive-Filament Formation in Y2O3 -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy

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Physical Review Applied

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Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier

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Applied Physics Letters

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Photothermal catalytic properties of layered titanium chalcogenide nanomaterials

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Dalton Transactions

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Production of Fe nanoparticles from γ-Fe2O3 by high-pressure hydrogen reduction

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Nanoscale Advances

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Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices

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Advanced Electronic Materials

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Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes

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Journal of Applied Physics

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Atomically interface engineered micrometer-thick SrMoO3 oxide electrodes for thin-film BaxSr1-xTiO3 ferroelectric varactors tunable at low voltages

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Sol–gel based synthesis and enhanced processability of MAX phase Cr2GaC

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Enabling nanoscale flexoelectricity at extreme temperature by tuning cation diffusion

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Nature Communications

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Temperature-Dependent Evolution of Crystallographic and Domain Structures in (K,Na,Li)(Ta,Nb)O<inf>3</inf>Piezoelectric Single Crystals

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IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

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Electrical characterization and failure analysis using operando TEM

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Conference Proceedings from the International Symposium for Testing and Failure Analysis

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conference-paper

FIB based fabrication of an operative Pt/HfO<inf>2</inf>/TiN device for resistive switching inside a transmission electron microscope

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Ultramicroscopy

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Piezoelectricity and rotostriction through polar and non-polar coupled instabilities in bismuth-based piezoceramics

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Scientific Reports

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